Machine learning-based imaging system for surface defect inspection
Crossref DOI link: https://doi.org/10.1007/s40684-016-0039-x
Published Online: 2016-07-10
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Je-Kang
Kwon, Bae-Keun
Park, Jun-Hyub
Kang, Dong-Joong
License valid from 2016-07-01