Real-Time Interface Prediction During Laser Processing of Thin Film Layers by High-Resolution Femtosecond Laser-Induced Breakdown Spectroscopy
Crossref DOI link: https://doi.org/10.1007/s40684-025-00715-2
Published Online: 2025-02-26
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jang, Inseok
Lee, Jaepil
Jeong, Sungho https://orcid.org/0000-0001-9374-118X
Text and Data Mining valid from 2025-02-26
Version of Record valid from 2025-02-26
Article History
Received: 12 November 2024
Revised: 4 February 2025
Accepted: 5 February 2025
First Online: 26 February 2025
Declarations
:
: The authors declare no conflict of interest/competing interests.