Development and First Assessment of a DIC System for a Micro-Tensile Tester Used for Solder Characterization
Crossref DOI link: https://doi.org/10.1007/s40799-017-0175-4
Published Online: 2017-02-23
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Benabou, L.
Tao, Q.B.
License valid from 2017-02-23
