Document is current
Any future updates will be listed below
-
Authors
Wei, Lihua
Geng, Shenglu
Liu, Hailu
Deng, Liang
Mao, Yiyang
Ning, Yanbin
Wang, Biqiong
Xiong, Yueping
Zhang, Yan
Lou, Shuaifeng
- License Information
-
More Information
Article History
Received: 29 May 2025
Accepted: 10 September 2025
First Online: 1 January 2026
Declarations
:
: The authors declare no interest conflict. They have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
: Figures of TEM and SEM images, HRTEM image, SEAD patterns, STEM image and EDS mappings, XPS high-resolution spectra, XAS spectra and XANES spectra, CV curves, charge-discharge curves, cycling performances, cyclic voltammograms, EIS results, linear fitting results of i p vs. v 1/2 , pseudocapacitive contributions, equivalent circuit, and DRT profiles. Table of Rietveld refinement results and equivalent circuit fitting data.
