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Non-contact and non-destructive in-situ inspection for CdSe quantum dot film based on the principle of field-induced photoluminescence quenching

Crossref DOI link: https://doi.org/10.1007/s40843-024-3090-8

Published Online: 2024-09-19

Published Print: 2024-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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