Reliability Analysis for Electronic Devices Using Beta Generalized Weibull Distribution
Crossref DOI link: https://doi.org/10.1007/s40995-019-00730-4
Published Online: 2019-06-14
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ali, Sajid http://orcid.org/0000-0003-4868-7932
Ali, Shafaqat
Shah, Ismail
Khajavi, Ali Noori
Funding for this research was provided by:
Higher Education Commision, Pakistan (21-1859/SRGP/R&D/HEC/2018)
Text and Data Mining valid from 2019-06-14
Version of Record valid from 2019-06-14
Article History
Received: 11 December 2018
Accepted: 1 June 2019
First Online: 14 June 2019