Investigation of Single Event Upset and Its Mitigation in Hetero Junctionless Tunnel FET SRAM Cell
Crossref DOI link: https://doi.org/10.1007/s40998-025-00804-7
Published Online: 2025-04-21
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aishwarya, K.
Lakshmi, B.
Text and Data Mining valid from 2025-04-21
Version of Record valid from 2025-04-21
Article History
Received: 1 July 2024
Accepted: 5 March 2025
First Online: 21 April 2025
Declarations
:
: The authors declare no competing interests.