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Item exposure and utilization control methods for optimal test assembly

Crossref DOI link: https://doi.org/10.1007/s41237-023-00214-1

Published Online: 2023-12-11

Published Print: 2024-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Lim, Sangdon https://orcid.org/0000-0002-2988-014X
Choi, Seung W. https://orcid.org/0000-0003-4777-5420
License Information

Text and Data Mining valid from 2023-12-11

Version of Record valid from 2023-12-11
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Article History

Received: 18 July 2023

Accepted: 30 October 2023

First Online: 11 December 2023

Declaration

:

: The authors have no relevant financial or non-financial interests to disclose.