Experimental study of temperature dependence of single-event upset in SRAMs
Crossref DOI link: https://doi.org/10.1007/s41365-016-0014-9
Published Online: 2016-02-27
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cai, Li
Guo, Gang
Liu, Jian-Cheng
Fan, Hui
Shi, Shu-Ting
Wang, Hui
Wang, Gui-Liang
Shen, Dong-Jun
HUI, Ning
He, An-Lin
Text and Data Mining valid from 2016-02-01