Readout electronics for a high-resolution soft X-ray spectrometer based on silicon drift detector
Crossref DOI link: https://doi.org/10.1007/s41365-016-0160-0
Published Online: 2016-12-01
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Er-Lei
Feng, Chang-Qing
Liu, Shu-Bin
Ye, Chun-Feng
Jin, Dong-Dong
Lian, Jian
Hu, Hui-Jun
License valid from 2016-12-01