Scan system for arbitrary-shaped samples at the synchrotron radiation facility
Crossref DOI link: https://doi.org/10.1007/s41365-017-0210-2
Published Online: 2017-03-28
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lan, Xu-Ying
Liang, Dong-Xu
Mao, Cheng-Wen
License valid from 2017-03-28