Total ionizing dose effect of gamma rays on H-gate PDSOI MOS devices at different dose rates
Crossref DOI link: https://doi.org/10.1007/s41365-017-0295-7
Published Online: 2017-09-09
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Qian-Qiong
Liu, Hong-Xia
Wang, Shu-Long
Fei, Chen-Xi
Zhao, Dong-Dong
Chen, Shu-Peng
Chen, Wei
License valid from 2017-09-09