Analysis of single-event transient sensitivity in fully depleted silicon-on-insulator MOSFETs
Crossref DOI link: https://doi.org/10.1007/s41365-018-0391-3
Published Online: 2018-03-13
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xu, Jing-Yan
Chen, Shu-Ming
Song, Rui-Qiang
Wu, Zhen-Yu
Chen, Jian-Jun
Text and Data Mining valid from 2018-03-13
Article History
Received: 12 July 2017
Revised: 31 August 2017
Accepted: 17 September 2017
First Online: 13 March 2018