X-ray detection based on complementary metal-oxide-semiconductor sensors
Crossref DOI link: https://doi.org/10.1007/s41365-018-0528-4
Published Online: 2019-01-02
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cheng, Qian-Qian
Ma, Chun-Wang
Yuan, Yan-Zhong
Wang, Fang
Jin, Fu
Liu, Xian-Feng
Text and Data Mining valid from 2019-01-01
Article History
Received: 7 August 2018
Revised: 23 October 2018
Accepted: 3 November 2018
First Online: 2 January 2019