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Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis

Crossref DOI link: https://doi.org/10.1007/s41365-021-00943-6

Published Online: 2021-10-04

Published Print: 2021-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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