Utilizing BP neural networks to accurately reconstruct the tritium depth profile in materials for BIXS
Crossref DOI link: https://doi.org/10.1007/s41365-024-01569-0
Published Online: 2024-12-20
Published Print: 2025-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhao, Chen
Jin, Wei
Shi, Yan
Chen, Chang-An
Zhao, Yi-Ying https://orcid.org/0000-0002-1424-2516
Text and Data Mining valid from 2024-12-20
Version of Record valid from 2024-12-20
Article History
Received: 23 February 2024
Revised: 26 March 2024
Accepted: 8 April 2024
First Online: 20 December 2024
Declaration
:
: The authors declare that they have no conflict of interest.