Extensive Laser Fault Injection Profiling of 65 nm FPGA
Crossref DOI link: https://doi.org/10.1007/s41635-017-0016-z
Published Online: 2017-09-01
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Breier, Jakub https://orcid.org/0000-0002-7844-5267
He, Wei
Bhasin, Shivam
Jap, Dirmanto
Chef, Samuel
Ong, Hock Guan
Gan, Chee Lip
Text and Data Mining valid from 2017-09-01
Article History
Received: 10 April 2017
Accepted: 28 August 2017
First Online: 1 September 2017