Deep Neural Network–Based Detection and Verification of Microelectronic Images
Crossref DOI link: https://doi.org/10.1007/s41635-019-00088-4
Published Online: 2020-01-04
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Reza, Md Alimoor https://orcid.org/0000-0001-7692-817X
Chen, Zhenhua
Crandall, David J.
Funding for this research was provided by:
Naval Engineering Education Consortium (N00174-16-C-0016)
Indiana Innovation Institute (N/A)
Text and Data Mining valid from 2020-01-04
Version of Record valid from 2020-01-04
Article History
Received: 11 June 2019
Accepted: 18 November 2019
First Online: 4 January 2020