Classification of single and double-gate nanoscale MOSFET with different dielectrics from electrical characteristics using soft computing techniques
Crossref DOI link: https://doi.org/10.1007/s41870-019-00301-1
Published Online: 2019-04-05
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Deyasi, Arpan
Mukherjee, Soumen
Bhattacharjee, Arup Kumar
Sarkar, Angsuman
Text and Data Mining valid from 2019-04-05
Article History
Received: 17 March 2018
Accepted: 28 March 2019
First Online: 5 April 2019