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Insight mechanisms of complex roughening dynamics and investigation of fractal parameters, optical constant, and dispersion parameters of CdS thin films for p-n (n-CdS/p-Si) heterojunction-based photodetector

Crossref DOI link: https://doi.org/10.1007/s42247-025-01018-7

Published Online: 2025-02-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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