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Thickness-dependent surface morphology, fractality, and its influence on the opto-electrical performance of SnS thin films for photodetector applications

Crossref DOI link: https://doi.org/10.1007/s42247-025-01118-4

Published Online: 2025-06-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Vinita, https://orcid.org/0009-0001-7576-2363
Kumar, Chandra https://orcid.org/0000-0002-3354-5782
Yadav, R. P. https://orcid.org/0000-0002-1101-2459
Singh, B. K. https://orcid.org/0000-0002-6292-7253
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Text and Data Mining valid from 2025-06-05

Version of Record valid from 2025-06-05
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Article History

Received: 19 March 2025

Accepted: 5 May 2025

First Online: 5 June 2025

Declarations

:

: The authors have declared that no conflict of interest.