Effect of Hydrogen Gas Conditions on the Structural, Optical, and Electronic Features of nc-Si:H Thin Films
Crossref DOI link: https://doi.org/10.1007/s42341-019-00104-y
Published Online: 2019-03-16
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shim, Jae-Hyun http://orcid.org/0000-0002-9084-8843
Kim, Ju-Han
Cho, Nam-Hee
Funding for this research was provided by:
Dongshin University
Text and Data Mining valid from 2019-03-16
Article History
Received: 18 December 2018
Revised: 21 February 2019
Accepted: 22 February 2019
First Online: 16 March 2019