Dependency of Si Content on the Performance of Amorphous SiZnSnO Thin Film Transistor Based Logic Circuits for Next-Generation Integrated Circuits
Crossref DOI link: https://doi.org/10.1007/s42341-019-00107-9
Published Online: 2019-04-01
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Byeong Hyeon
Kim, Sangsig
Lee, Sang Yeol http://orcid.org/0000-0002-6351-2156
Text and Data Mining valid from 2019-04-01
Article History
Received: 26 December 2018
Revised: 21 March 2019
Accepted: 23 March 2019
First Online: 1 April 2019