Double Junction Characteristics of Amorphous TiO2 Thin Film Due to Various Potential Barriers
Crossref DOI link: https://doi.org/10.1007/s42341-019-00133-7
Published Online: 2019-11-03
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Oh, Teresa http://orcid.org/0000-0002-4194-381X
Text and Data Mining valid from 2019-11-03
Version of Record valid from 2019-11-03
Article History
Received: 28 March 2019
Revised: 16 June 2019
Accepted: 30 July 2019
First Online: 3 November 2019