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Research on Electromagnetic Effect of Irradiation on Silicon via Interconnects

Crossref DOI link: https://doi.org/10.1007/s42341-020-00174-3

Published Online: 2020-02-10

Published Print: 2020-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Xu, Xiaofei

Li, Denghua
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Text and Data Mining valid from 2020-02-10

Version of Record valid from 2020-02-10
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Article History

Received: 25 June 2019

Revised: 4 November 2019

Accepted: 20 January 2020

First Online: 10 February 2020