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Transmission Line Method Analysis on the Electrical Properties of Bi-Layer Channel Oxide Thin Film Transistors with Oxide-Metal-Oxide Electrodes

Crossref DOI link: https://doi.org/10.1007/s42341-020-00232-w

Published Online: 2020-07-31

Published Print: 2020-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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