Influence of Si–In–Zn–O/Ag/Si–In–Zn–O Electrode on Amorphous Si–Zn–Sn–O Thin Film Transistors
Crossref DOI link: https://doi.org/10.1007/s42341-020-00277-x
Published Online: 2021-01-08
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hwang, Jin Young
Lee, Sang Yeol http://orcid.org/0000-0002-6351-2156
Text and Data Mining valid from 2021-01-08
Version of Record valid from 2021-01-08
Article History
Received: 27 September 2020
Revised: 13 December 2020
Accepted: 21 December 2020
First Online: 8 January 2021