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Modeling and Verification of Interface and Bulk Trap Level Density Extraction in SONOS Memory Charge Trapping Layer

Crossref DOI link: https://doi.org/10.1007/s42341-021-00313-4

Published Online: 2021-04-27

Published Print: 2021-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nam, Ki-Ryung

Jeong, Jun-Kyo

Sung, Jae-Young

Lee, Ga-Won https://orcid.org/0000-0001-5285-4815
License Information

Text and Data Mining valid from 2021-04-27

Version of Record valid from 2021-04-27
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Article History

Received: 23 October 2020

Revised: 20 January 2021

Accepted: 17 March 2021

First Online: 27 April 2021