Correction to: Effect of Silicon Doping on the Electrical Performance of Amorphous SiInZnO Thin‑film Transistors
Crossref DOI link: https://doi.org/10.1007/s42341-021-00323-2
Published Online: 2021-04-22
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Byeong Hyeon
Kim, Dae‑Hwan
Lee, Doo‑Yong
Park, Sungkyun
Kim, Sangsig
Kwon, Hyuck‑In
Lee, Sang Yeol https://orcid.org/0000-0002-6351-2156
Text and Data Mining valid from 2021-04-22
Version of Record valid from 2021-04-22
Article History
First Online: 22 April 2021
Free to read: This content has been made available to all.