Conductive Filament Variation of RRAM and Its Impact on Single Event Upset
Crossref DOI link: https://doi.org/10.1007/s42341-021-00343-y
Published Online: 2021-06-10
Published Print: 2022-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vijay, H. M.
Ramakrishnan, V. N.
Text and Data Mining valid from 2021-06-10
Version of Record valid from 2021-06-10
Article History
Received: 5 December 2020
Revised: 2 June 2021
Accepted: 7 June 2021
First Online: 10 June 2021
Declaration
:
: The author declares that they have no conflict of interest.