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Investigation of the Stability and the Transparency of Oxide Thin Film Transistor with bi-Layer Channels and Oxide/Metal/Oxide Multilayer Source/Drain Electrodes

Crossref DOI link: https://doi.org/10.1007/s42341-022-00384-x

Published Online: 2022-02-17

Published Print: 2022-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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