Improvement of Device Reliability and Variability Using High Pressure Deuterium Annealing
Crossref DOI link: https://doi.org/10.1007/s42341-022-00422-8
Published Online: 2022-11-04
Published Print: 2023-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jung, Dae-Han
Yoon, Sung-Su
Ku, Ja-Yun
Wang, Dong-Hyun
Lee, Khwang-Sun
Park, Jun-Young https://orcid.org/0000-0003-4830-9739
Text and Data Mining valid from 2022-11-04
Version of Record valid from 2022-11-04
Article History
Received: 17 August 2022
Revised: 18 October 2022
Accepted: 21 October 2022
First Online: 4 November 2022