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Frequency Response Characteristics Depending on the Metal Capping Structure and Length of the Amorphous SiZnSnO Thin Film Transistor

Published Online: 2023-06-14

Published Print: 2023-08

Authors

Lee, Ji Ye

Ju, Byeong-Kwon

Lee, Sang Yeol https://orcid.org/0000-0002-6351-2156
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Text and Data Mining valid from 2023-06-14

Version of Record valid from 2023-06-14
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Article History

Received: 12 February 2023

Revised: 23 May 2023

Accepted: 28 May 2023

First Online: 14 June 2023

Declarations

:

: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

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