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Retraction Note: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials

Published Online: 2024-08-01

Published Print: 2024-10

Authors

Ganeswara Rao, M. V.

Ramanjaneyulu, N.

Madugula, Sumalatha

Dharani, N. P.

Rajesh Babu, K.

Sagar, Kallepelli
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First Online: 1 August 2024

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