Application of Mask R-CNN and YOLOv8 algorithms for defect detection in printed circuit board manufacturing
Crossref DOI link: https://doi.org/10.1007/s42452-025-06641-x
Published Online: 2025-03-24
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Calabrese, Maurizio
Agnusdei, Leonardo
Fontana, Gianmauro
Papadia, Gabriele
Del Prete, Antonio
Text and Data Mining valid from 2025-03-24
Version of Record valid from 2025-03-24
Article History
Received: 5 July 2024
Accepted: 23 March 2025
First Online: 24 March 2025
Declarations
:
: The authors declare no competing interests.