Document is current

Any future updates will be listed below

Correction: Application of Mask R-CNN and YOLOv8 algorithms for defect detection in printed circuit board manufacturing

Crossref DOI link: https://doi.org/10.1007/s42452-025-06802-y

Published Online: 2025-04-23

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark