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Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene

Crossref DOI link: https://doi.org/10.1007/s42649-019-0005-5

Published Online: 2019-04-29

Published Print: 2019-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kim, Kangsik

Yoon, Jong Chan

Kim, Jaemin

Kim, Jung Hwa

Lee, Suk Woo

Yoon, Aram

Lee, Zonghoon
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Text and Data Mining valid from 2019-04-29
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Article History

Received: 17 January 2019

Accepted: 12 February 2019

First Online: 29 April 2019

Competing interests

: The authors declare that they have no competing interests.

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