Crossmark

Development of an Efficient Integrated Test Circuit for Overcurrent and Short Circuit Current Testing of the MMC-Based MVDC Valve

Published Online: 2025-04-02

Published Print: 2025-05

Authors

Kim, Chul-Min

Park, Beom-Su

Kim, Tae-Jin

Kim, Jong-Soo https://orcid.org/0000-0002-9210-1890
Funding

Funding for this research was provided by:

Korea Institute of Energy Technology Evaluation and Planning (20225500000120)
License Information

Text and Data Mining valid from 2025-04-02

Version of Record valid from 2025-04-02
More Information

Article History

Received: 20 October 2024

Revised: 12 March 2025

Accepted: 14 March 2025

First Online: 2 April 2025

Declarations

:

: The authors declare that we have no competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Document is current