Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid
Crossref DOI link: https://doi.org/10.1007/s43236-020-00075-x
Published Online: 2020-03-31
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Heo, Kyung-Wook
Choi, Hyun-Jun
Jung, Jee-Hoon https://orcid.org/0000-0002-4055-3764
Funding for this research was provided by:
Korea Institute of Energy Technology Evaluation and Planning (20192010106750)
Text and Data Mining valid from 2020-03-31
Version of Record valid from 2020-03-31
Article History
Received: 19 February 2020
Revised: 5 March 2020
Accepted: 6 March 2020
First Online: 31 March 2020