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Numerical junction temperature calculation method for reliability evaluation of power semiconductors in power electronics converters

Published Online: 2020-09-23

Published Print: 2021-01

Authors

Du, Xiao

Du, Xiong https://orcid.org/0000-0002-0212-1653
Zhang, Jun

Li, Gaoxian
Funding

Funding for this research was provided by:

Chongqing Science and Technology Commission (cstc2019jcyj-zdxmX0005)
License Information

Text and Data Mining valid from 2020-09-23

Version of Record valid from 2020-09-23
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Article History

Received: 29 May 2020

Revised: 3 September 2020

Accepted: 4 September 2020

First Online: 23 September 2020

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