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Correction method for calculating junction temperature considering parasitic effects in SiC MOSFETs

Published Online: 2022-11-30

Published Print: 2023-04

Authors

Liu, Fan

Du, Mingxing https://orcid.org/0000-0003-3107-0995
Yin, Jinliang

Dong, Chao

Ouyang, Ziwei
Funding

Funding for this research was provided by:

Tianjin Municipal Science and Technology Project (No.20YDTPJC00510)
License Information

Text and Data Mining valid from 2022-11-30

Version of Record valid from 2022-11-30
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Article History

Received: 30 May 2022

Revised: 9 November 2022

Accepted: 10 November 2022

First Online: 30 November 2022

Declarations

:

: On behalf of all authors, the corresponding author states that there is no conflict of interest.

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