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Portable multiscale form measurement technique for structured specular surfaces based on phase measuring deflectometry

Crossref DOI link: https://doi.org/10.1007/s44267-023-00017-8

Published Online: 2023-08-24

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Xu, Yongjia https://orcid.org/0000-0002-6258-713X
Gao, Feng https://orcid.org/0000-0003-3835-6929
Yu, Yang https://orcid.org/0000-0001-8460-9320
Wang, Jian https://orcid.org/0000-0001-7356-8789
Jiang, Xiangqian https://orcid.org/0000-0001-7949-8507
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Text and Data Mining valid from 2023-08-24

Version of Record valid from 2023-08-24
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Article History

Received: 16 January 2023

Revised: 16 May 2023

Accepted: 15 June 2023

First Online: 24 August 2023

Declarations

:

: The authors declare no competing interests.