Forget About Electron Micrographs: A Novel Guide for Using 3D Models for Quantitative Analysis of Dense Reconstructions
Crossref DOI link: https://doi.org/10.1007/978-1-0716-0691-9_14
Published Online: 2020-06-30
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Boges, Daniya J.
Agus, Marco
Magistretti, Pierre Julius
Calì, Corrado
Text and Data Mining valid from 2020-01-01
Version of Record valid from 2020-01-01
Chapter History
First Online: 30 June 2020