RTN and Its Intrinsic Interaction with Statistical Variability Sources in Advanced Nano-Scale Devices: A Simulation Study
Crossref DOI link: https://doi.org/10.1007/978-3-030-37500-3_13
Published Online: 2020-04-27
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Adamu-Lema, F.
Compagnoni, C. Monzio
Badami, O.
Georgiev, V.
Asenov, A.
Text and Data Mining valid from 2020-01-01
Chapter History
First Online: 27 April 2020