X-Ray Photoelectron Spectroscopy (XPS): Principles and Application for the Analysis of Photoactive Materials
Crossref DOI link: https://doi.org/10.1007/978-3-030-63713-2_10
Published Online: 2022-06-26
Published Print: 2022
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Simon, Pardis http://orcid.org/0000-0003-4031-4074
Baldovino-Medrano, VĂctor G. http://orcid.org/0000-0003-3227-0251
Wojcieszak, Robert http://orcid.org/0000-0002-8956-5846
Text and Data Mining valid from 2022-01-01
Version of Record valid from 2022-01-01
Chapter History
First Online: 26 June 2022