Volume Scanning Electron Microscopy: Serial Block-Face Scanning Electron Microscopy Focussed Ion Beam Scanning Electron Microscopy
Crossref DOI link: https://doi.org/10.1007/978-3-319-68997-5_5
Published Online: 2017-12-31
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Webb, Richard I.
Schieber, Nicole L.
License valid from 2017-12-31