Integrated Circuit Design and Electromigration
Crossref DOI link: https://doi.org/10.1007/978-3-319-73558-0_3
Published Online: 2018-02-24
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lienig, Jens
Thiele, Matthias
License valid from 2018-01-01