NEM: A NEW In-VM Monitoring with High Efficiency and Strong Isolation
Crossref DOI link: https://doi.org/10.1007/978-3-319-73830-7_39
Published Online: 2018-01-18
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Qin, Jingjie
Shi, Bin
Li, Bo
License valid from 2018-01-01