Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1−xGaxSe2 for Complex Dielectric Function Determination and Parameterization
Crossref DOI link: https://doi.org/10.1007/978-3-319-75377-5_11
Published Online: 2019-01-11
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ibdah, Abdel-Rahman A.
Aryal, Puruswottam
Pradhan, Puja
Marsillac, Sylvain
Podraza, Nikolas J.
Collins, Robert W.
Text and Data Mining valid from 2018-01-01
Chapter History
First Online: 11 January 2019