Comparison of E-mode GaN HEMT Using Different Gate Oxide Stack Approach
Crossref DOI link: https://doi.org/10.1007/978-3-319-75605-9_2
Published Online: 2018-06-26
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chang, Edward Yi
Wu, Chia-Hsun
Lin, Yueh-Chin
Han, Ping-Cheng
Huang, Yu-Xiang
Luc, Quang Ho
Chen, Jian-You
Ho, Yu-Hsuan
License valid from 2018-06-26